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Stimulus Induced Fault Testing (SIFT)
-- Go beyond OBIRCH & TIVA type methods with high aspect contiguous scans
The image above shows a Crystal Vision probe station-based microscope system in a dark-box, optimized for SIFT
SIFT allows for the analysis of numerous stimuli to
identify speed, fault,
and parametric differences in silicon. The heart of the SIFT
technique revolves
around intentionally disturbing devices with external stimuli and
comparing
the test criteria to reference parts or timing/voltage
sensitivities. Synchronous interfacing is possible to any tester
without any wiring or program changes. The system can be based on
either a motorized probe station or portable microscope stand for test head
applications.
The SIFT scanner does not use traditional laser scanning microscope
optics and is actually quite straightforward in construction. DUT
scan area can be from microns to 300mm or more, allowing whole boards,
packages and die to be analyzed since the scanners are stepper-based
rather than internal optics based.
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Spot = 500 microns
Scan = 9x14
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Spot = 100 microns |
Spot = 50 microns |
126 test loops for 9x14 area Test
time
= 500 msec/loop
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White
Paper on SIFT Methods and Benefits Click Here |
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