FA Instruments - Products for Analytical Microscopy

...By Failure Analysts, For Failure Analysts...

FA Instruments, Inc. is committed to building a corporation that is recognized as an industry leader in test and failure analysis equipment as well as technical support and service. Our core competencies include Electrical Engineering, Mechanical Engineering, Python and C programming coupled with a specialized understanding of Analytical Test and Failure Analysis of Semiconductors. Our relevant and significant past experiences include, inventor of the “vibe coupler", "portable emission microscope” and technical creator of the FA1000, which was marketed by Alpha Innotech Corporation. The original FA1000 liquid cooled camera was a huge success, selling on approximately 100 Emission Microscopes and almost 1500 systems for Life Sciences. Our core competencies make it possible to provide straightforward, powerful tools for the Failure Analysis community.

FA Instruments specializes in failure analysis tools to investigate faults, defects and damage to semiconductors with scientific grade systems for Photon Emission detection in the visible to NIR range. We also manufacture “SIFT” Stimulus Induced Fault Testing systems.

FA Instruments specializes in the following failure analysis techniques:

Frontside photoemission microscopy

Moire Thermal Imaging

FMI

Backside photoemission microscopy

SIFT: (Stimulus Induced Fault Testing)

Time of Flight SIFT (Available for Development and Licensing)

In addition, FA Instruments offers the coherent laser light source designed by Jim Colvin Consulting Services that has proven to be a superior light source for backside photon emission applications. This unit, in standard configuration, houses three lasers at 670nm for front side imaging in the visible range, 1064nm for imaging the backside through the silicon substrate and 1300nm for near-IR backside imaging with MCT or other mid-IR sensors.

Patent Portfolio:

US7872485: Functional Failure Analysis by Induced Stimulus

US7323888: System and method for use in functional failure analysis by induced stimulus

US5764409: Elimination of vibration by vibration coupling in microscopy applications

US5892539: Portable Emission Microscope Workstation for Failure Analysis

US5970167: Integrated Circuit Failure Analysis Using Color Voltage Contrast

US6112004: Emission Microscopy System and Method

US6134365: Coherent Illumination System and Method

US6245586: Wire-to-Wire Bonding System and Method

US6608291: Induction Heating Apparatus

US8400175: System and method for use in functional failure analysis by induced stimulus

US8797052: System and method for gradient thermal analysis by induced stimulus

US9034667: Apparatus and method for endpoint detection during electronic sample preparation

US9157935: Apparatus and method for endpoint detection during electronic sample preparation

US9411002: System and method for gradient thermal analysis by induced stimulus

US9465049: Apparatus and method for electronic sample preparation

-- One more currently pending --