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Publication of “‘In Situ’ Mechanical Sample Preparation of Selected Sites and
Components on Large Modules and Boards” @ ISTFA 2016
Patent Issued for Thermal relaxation and stabilization techniques during sample preparation
Patent issued for Thermal Gradient Methods
Patent issued for Thermal Gradient Apparatus
Additional Patent issued for SIFT
END-POINT PAPER WINS 'BEST IN CONFERENCE' AWARD @ ISTFA 2012
Please download our ISTFA Papers from the LIBRARY
Find Defect Sites through 3D Triangulation
Contact us to find out the latest about Time of Flight SIFT
or download the ISTFA Paper
Come see us @ ISTFA 2010!
Dallas, TX - Intercontinental Hotel - November 16-17 -- We are located at Booth # 707
Click here for Registration Information
Image copyright DL Burgess
In May 2010, President of FA Instruments, Jim Colvin updated the EDFAS Golden Gate Chapter on the challenges and solutions of Photo Voltaic failure analysis. For a copy of the presentation, or for further information, please contact email@example.com
New Location -- Expanded Service & Application Lab Facilities!
We have moved! Please note our move is just a few doors down. Our new phone system incorporates email to serve you better and we have added a dedicated sample prep room. Please update your records.
Our New Address is:
2381 Zanker Rd. Suite 100
San Jose, CA 95131
(408) 789 7560 (forwards voice message to email if no answer)
cell: (510) 851 5555
fax: (484) 210 2961
New Papers posted in the FAI Library
"Gradient Thermal Analysis by Induced Stimulus" - ISTFA 2009
"Comparative Failure Analysis of Photovoltaic Devices" -- ISTFA 2009
Tri-port Crystal Vision Systems now shipping!
Shown above is a tri-port Crystal Vision system optimized for SIFT and photon emission
FA Instruments introduces a major new expansion to our applications portfolio. The use of our patented SIFT and NIR-based analytical technologies offers the means for unsurpassed information-gathering through high sensitivity scans of all sizes of solar cell.
For more information, please follow this link.
We were proud to be located on the Booth of our China Sales Partners, BE-FIRST TECHNOLOGY . Thanks for stopping by the Booth!
THANKS FOR MAKING ISTFA & 2007 A GREAT SUCCESS!
FA Instruments would like to thank all the visitors to our booth at ISTFA this year!
As you have seen, 2007 has been a year of significant milestones in FAI's technology portfolio and our growth as a leader in the field. Our new integrated offerings in SIFT and in VISGaAs and InSb sensor technologies allow us to further push the boundaries of FA.
We thank you for opening the door to better analytical techniques!
NEW COMPANY BROCHURE
Download a copy of our new brochure by clicking here -- or request a hard copy by e-mailing us
New Company Ads
See us @ ISTFA 2007 - San Jose Convention Center - November 4-8
We are also proud to be a Platinum Level Show Sponsor of the ISTFA Conference
-- Booth # 503
InSb Sensor Images (640 x 480) are Here!
FA Instruments is pleased to announce another "FIRST": the availability of InSb sensor technology to achieve Mid-range thermal imaging. Contact us to find out more about the FA products and services we offer which allow you to achieve the best analytical results with this exciting technology.
FAI Company CEO to give FA Tutorial at IEEE IRPS 2007
RELIABILITY PHYSICS TUTORIALS , Monday April 15-16 - Room D, 1.00 to 2.30pm , Phoenix Convention Center , Phoenix, AZ
This tutorial will demonstrate how to get reliable failure analysis information by way of an overview of the FA tools and methods with insightful examples. You will leave with an enhanced understanding of FA capabilities, myths and limitations so as to better drive towards a true root cause determination. This is a must see tutorial not just for failure analysts but those individuals who request or receive failure analysis data.
Click here for the Slide Presentation
FA Instruments exhibiting at SEMICON WEST!
We will be at booth #Booth 5234 North Hall.
InGaAs Systems now Shipping!
Click here to find out more.
Advancing IC Diagnostics Newsletter - New Issue
Click Image to Download. This Issues features our new InGaAs Camera, and the Software Parametric Analyser built into Crystal Vision.
Come & See us @ IEEE IRPS 2006 -- www.irps.org
Exhibits Open: March 28
&,29, 9 00 a.m.- 5:00 p.m..
March 30: 9:00 a.m. - 12:00 p.m.
San Jose McEnery Convention Center / Hilton S.J. · San Jose, California
FA INSTRUMENTS is at BOOTH # 300
Click Here to Download a FREE Exhibits-only pass
click image to download
NEW- Case Study: Analysis of Ohmic Leakage
September 2005 - Advancing IC Diagnostics Newsletter
click image to download
July 2005 - SEMICON WEST - San Francisco July 12 to 14
Come and see our equipment and product specialists on booth 5143 in the North Hall. You can find out more at www.semi.org
We look forward to meeting you!
July 2005 - IPFA - Singapore
Thank you to all the people who visited us at IPFA. The Show was a big success!
A new technical paper we presented at IPFA on Moire Thermal Imaging. The paper is available for download from our Technical Library or by clicking here.
June 2005 - Applications Lab is open for business - Come & Demo our Products in Silicon Valley!
Our demonstration laboratory is fully equipped with the full range of FA Instruments' microscopy solutions as well as a full range of sample preparation systems and analytical tools.
This allows us to offer an unique fully integrated approach to solve your problems. Schedule a visit to see how we can help you improve your failure analysis capabilities.
May 2005 - New Invited Article in Major Industry Journal
FAI announces that Company President, Jim Colvin, is featured in a major industry article as invited Guest Columnist.
The article, entitled "Frequently Asked Questions and the Future of Failure Analysis"; can be found in EDFA Vol 7, No.2. Please click here for a copy of the article.
May 2005 - IRPS 2005 - San Jose
FAI thanks you for visiting us at IRPS . It was great to meet so many customers and industry colleagues.
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