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Crystal Vision Microscopy suites are transforming the world of IC Diagnostics and failure analysis. Intuitive software allows user friendliness and enables the breadth of analytical disciplines available. Realtime imaging from both Topside and Backside, allows for maximum productivity. 

Our modular XP-based software provides a stable bedrock for the standard and optional modules.

 

We are pleased to offer systems based on either (or both) Extended range CCD  or advanced InGaAs sensors. 

 

 

Modules produce the most versatile system in the World!

We offer advanced technique and application modules to extend and enhance the usefulness of your chosen microscope. Typical modules are:

FMI

MOIRE THERMAL

LIQUID CRYSTAL

SIFT

In addition, an integrated software-driven PARAMETRIC ANALYZER  offers the analyst almost limitless ability to excite defect locations within the IC. Click here to find out more about the standard features and advanced options.

 

 

 

General Features & Benefits:

XP Professional based OS.

Automated capture process simplifying emission capture and overlays.

Advanced filter process for removal of hot pixel and cosmic ray noise.

Full control of illumination intensity including multiple laser lines.

Calibration tables matched to the camera for unsurpassed sensitivity and clarity.

Color overlays and multiple window views for emission comparison.

Histogram and image math functions.

Video feed out allows interface to existing probe station software.

13 bit Analog/ Digital hybrid enabling real-time imaging capability.

Excellent anti-blooming characteristics.

Selectable 8 bit readout control across 13 bit dynamic range.

 

 

Versatile Mounting options:

             

                            

Tester
    Probe Station

Bench Top

The photon emission incorporates the latest in our proprietary cameras and coherent laser illumination into a package that can easily be moved around to multiple workstations. 

 

 


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